Novel insights on the matrix effect of acid solutions in nitrogen microwave-induced plasma optical emission spectrometry: Analytes signal enhancement in formic acid

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Christiane Duyck , Edmilson Arruda dos Santos , João Victor Soares de Araújo , Thiago Silva Santos , Ricardo Jorgensen Cassella , Rafaella Regina Alves Peixoto
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引用次数: 0

Abstract

This study evaluated the matrix effect of acid solutions on the nitrogen microwave-induced plasma optical emission spectrometry (N2-MIP-OES) sensitivity of 24 elements. A model solution of 0.2 % nitric acid was used to compare the element's emission line sensitivity in nitric (1.0 %, and 5.0 %, v v−1), sulfuric (0.2 % and 1 %), hydrochloric, formic, and acetic acid solutions (0.2 %, 1.0 %, and 5.0 %, v v−1). The relative sensitivity was estimated by the linear regression slope (LRS) of signal intensities obtained at eight concentration levels (blank + standards). Principal component analysis (PCA) was applied to the LRS data to distinguish matrix effects. Signal enhancement was noted for a group of elements (Al, As, B, Ba, Cd, Co, Cu, Fe, Mn, Pb, Sr, and Zn) in formic acid solutions (0.2 % and 1 %) and varied from +50 % (Cd, Zn) to +80 % (B, Ba, Pb, Sr) of the corresponding sensitivity in HNO3 0.2 %. In contrast, signal suppression occurred for K (−15 %), Ca (−20 %), and Mg (−40 %) and in diluted hydrochloric solutions (0.2 % and 1 %). The ratio values of Mg(II)/Mg(I) and (N2+/OH) used in robustness metrics increased in these solutions, indicating higher robustness. An increase in CO+ species formation in the plasma was also observed. Refractory oxide-forming elements (Ce, Cr, La, Mo, Ni, Se, and V) were less impacted by acid matrix effects. This study aimed to contribute to the increasing interest in multi-elemental determination by MIP-OES.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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