Zohreh Hajiabadi, Irwan Purnama, Asep Nugroho, Hanyu Cao, Sridhar Chandrasekaran, Husneni Mukhtar, Dimitra G. Georgiadou, Harold M. H. Chong, David B. Thomas, Firman M. Simanjuntak
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引用次数: 0
Abstract
This study aims to exploit the resistance states of Cr/ZnO/TiN memristors to generate random numbers. A random number generator (RNG) circuit employing a single memristor is proposed. We suggest that current compliance (CC) is a significant parameter in determining the quality of randomness; it is found that low CCs (20-50 µA) have a wide resistance state distribution that facilitates random bits. This work provides insight into the implementation of memristors for data security applications.
期刊介绍:
Electronics Letters is an internationally renowned peer-reviewed rapid-communication journal that publishes short original research papers every two weeks. Its broad and interdisciplinary scope covers the latest developments in all electronic engineering related fields including communication, biomedical, optical and device technologies. Electronics Letters also provides further insight into some of the latest developments through special features and interviews.
Scope
As a journal at the forefront of its field, Electronics Letters publishes papers covering all themes of electronic and electrical engineering. The major themes of the journal are listed below.
Antennas and Propagation
Biomedical and Bioinspired Technologies, Signal Processing and Applications
Control Engineering
Electromagnetism: Theory, Materials and Devices
Electronic Circuits and Systems
Image, Video and Vision Processing and Applications
Information, Computing and Communications
Instrumentation and Measurement
Microwave Technology
Optical Communications
Photonics and Opto-Electronics
Power Electronics, Energy and Sustainability
Radar, Sonar and Navigation
Semiconductor Technology
Signal Processing
MIMO