Michael Seiler, Samson Frank, Dennis Thelemann, Oliver Elies, Pouria Teymori, Jens Bliedtner
{"title":"How laser material processing can benefit from OCT technology","authors":"Michael Seiler, Samson Frank, Dennis Thelemann, Oliver Elies, Pouria Teymori, Jens Bliedtner","doi":"10.1002/phvs.202400037","DOIUrl":null,"url":null,"abstract":"<p>Ultrashort-pulse (USP) laser ablation enables the creation of freeform shapes that are challenging to produce with conventional optics manufacturing techniques. To maintain the industrial standards of many branches, it is crucial to not only consider material removal rates but also the surface quality and subsurface damage (SSD). This study investigates the SSD patterns generated in fused silica and quantifies key parameters such as the SSD depth by applying optical coherence tomography (OCT).</p>","PeriodicalId":101021,"journal":{"name":"PhotonicsViews","volume":"22 1","pages":"52-55"},"PeriodicalIF":0.0000,"publicationDate":"2024-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/phvs.202400037","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"PhotonicsViews","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/phvs.202400037","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
Ultrashort-pulse (USP) laser ablation enables the creation of freeform shapes that are challenging to produce with conventional optics manufacturing techniques. To maintain the industrial standards of many branches, it is crucial to not only consider material removal rates but also the surface quality and subsurface damage (SSD). This study investigates the SSD patterns generated in fused silica and quantifies key parameters such as the SSD depth by applying optical coherence tomography (OCT).
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