A Mura model-based optical compensation for organic light-emitting diode display luminance nonuniformity utilizing two image capturing

IF 1.7 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Hyuckwon Kwon, Chanjin Park, Kyeong-Soo Kang, Ji-Hwan Park, Soo-Yeon Lee
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引用次数: 0

Abstract

In this paper, we proposed a new optical Mura compensation method that requires only a few Mura detections for all gray levels. We analyzed the characteristics of Mura resulting from process variations in the thin film transistor (TFT) of each pixel and developed a new model using a logarithmic function. The proposed compensation algorithm has been verified with simulation and experimental results. We found that the uniformity of the proposed compensation algorithm at 7G, 24G, 75G, 100G, 150G, and 255G, which required only two image captures, was comparable to those that required five captures. The model improved uniformity from 41.32% to 68.60% at 0.18 nit brightness, demonstrating its effectiveness. Additionally, the method significantly reduces the number of image captures needed from five to two and decreases the image capturing process time from 2183 to 150 ms, saving over 14 times in process efficiency. The proposed methodology demonstrates significant advancements in achieving luminance uniformity in OLED displays, addressing mass production constraints.

基于Mura模型的双图像捕获有机发光二极管显示亮度不均匀性光学补偿
本文提出了一种新的光学Mura补偿方法,该方法只需要对所有灰度级进行少量的Mura检测。我们分析了薄膜晶体管(TFT)中每个像素的工艺变化所导致的Mura特性,并利用对数函数建立了一个新的模型。仿真和实验结果验证了该补偿算法的有效性。我们发现,所提出的补偿算法在7G、24G、75G、100G、150G和255G时的均匀性与需要5次捕获的补偿算法相当,这些补偿算法只需要两次图像捕获。在0.18 nit亮度下,该模型将均匀性从41.32%提高到68.60%,证明了该模型的有效性。此外,该方法将所需的图像捕获数量从5个减少到2个,将图像捕获处理时间从2183 ms减少到150 ms,将处理效率提高了14倍以上。提出的方法在实现OLED显示器的亮度均匀性方面取得了重大进展,解决了大规模生产的限制。
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来源期刊
Journal of the Society for Information Display
Journal of the Society for Information Display 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.70%
发文量
98
审稿时长
3 months
期刊介绍: The Journal of the Society for Information Display publishes original works dealing with the theory and practice of information display. Coverage includes materials, devices and systems; the underlying chemistry, physics, physiology and psychology; measurement techniques, manufacturing technologies; and all aspects of the interaction between equipment and its users. Review articles are also published in all of these areas. Occasional special issues or sections consist of collections of papers on specific topical areas or collections of full length papers based in part on oral or poster presentations given at SID sponsored conferences.
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