Jiaxing Li;Zidong Wang;Jun Hu;Hongli Dong;Hongjian Liu
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引用次数: 0
Abstract
In this paper, the problem of cubature Kalman fusion filtering (CKFF) is addressed for multi-sensor systems under amplify-and-forward (AaF) relays. For the purpose of facilitating data transmission, AaF relays are utilized to regulate signal communication between sensors and filters. Here, the randomly varying channel parameters are represented by a set of stochastic variables whose occurring probabilities are permitted to exhibit bounded uncertainty. Employing the spherical-radial cubature principle, a local filter under AaF relays is initially constructed. This construction ensures and minimizes an upper bound of the filtering error covariance by designing an appropriate filter gain. Subsequently, the local filters are fused through the application of the covariance intersection fusion rule. Furthermore, the uniform boundedness of the filtering error covariance's upper bound is investigated through establishing certain sufficient conditions. The effectiveness of the proposed CKFF scheme is ultimately validated via a simulation experiment concentrating on a three-phase induction machine.
期刊介绍:
The IEEE/CAA Journal of Automatica Sinica is a reputable journal that publishes high-quality papers in English on original theoretical/experimental research and development in the field of automation. The journal covers a wide range of topics including automatic control, artificial intelligence and intelligent control, systems theory and engineering, pattern recognition and intelligent systems, automation engineering and applications, information processing and information systems, network-based automation, robotics, sensing and measurement, and navigation, guidance, and control.
Additionally, the journal is abstracted/indexed in several prominent databases including SCIE (Science Citation Index Expanded), EI (Engineering Index), Inspec, Scopus, SCImago, DBLP, CNKI (China National Knowledge Infrastructure), CSCD (Chinese Science Citation Database), and IEEE Xplore.