Reliability analysis of k/n(G) degradation system under dependent competing failures

IF 2.1 2区 数学 Q1 MATHEMATICS, APPLIED
Zaizai Yan, Yanjie Shi, Xiuyun Peng
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引用次数: 0

Abstract

This paper examines the reliability of k/n(G) systems composed of components with multiple performances that degrade over time, resulting in competing failures between soft and hard failures. The flexible Tweedie Exponential Diffusion process is employed to model the performance degradation, while the dependence between multiple performances degradation processes is established by the Copula functions. Additionally, we utilize the Weibull distribution to characterize the failure times of hard failures and construct a proportional hazards model to relate the hard failure rate to performance degradation. To estimate the model parameters and reliability function, we apply a two-stage Bayesian approach, employing the efficient Hamiltonian Monte Carlo algorithm for parameter estimation. Through simulation studies, the proposed model and method have good statistical inference performance. Finally, the constructed model and method are implemented in real data to showcase its practical applicability.
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来源期刊
CiteScore
5.40
自引率
4.20%
发文量
437
审稿时长
3.0 months
期刊介绍: The Journal of Computational and Applied Mathematics publishes original papers of high scientific value in all areas of computational and applied mathematics. The main interest of the Journal is in papers that describe and analyze new computational techniques for solving scientific or engineering problems. Also the improved analysis, including the effectiveness and applicability, of existing methods and algorithms is of importance. The computational efficiency (e.g. the convergence, stability, accuracy, ...) should be proved and illustrated by nontrivial numerical examples. Papers describing only variants of existing methods, without adding significant new computational properties are not of interest. The audience consists of: applied mathematicians, numerical analysts, computational scientists and engineers.
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