Assessment of Test Voltage Levels for Accurate Type II Insulation Lifetime Evaluation Under Different Pressure Conditions

IF 5.1 2区计算机科学 Q1 ENGINEERING, AEROSPACE

IEEE Transactions on Aerospace and Electronic Systems Pub Date : 2025-01-20 DOI:10.1109/taes.2025.3531842

Yatai Ji, Paolo Giangrande, Weiduo Zhao, Jing Zhang, Pinjia Zhang

引用次数: 0

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在不同压力条件下对II型绝缘寿命进行准确评估的试验电压等级评估

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Aerospace and Electronic Systems 工程技术-电信学

CiteScore

7.80

自引率

13.60%

发文量

433

审稿时长

8.7 months

期刊介绍： IEEE Transactions on Aerospace and Electronic Systems focuses on the organization, design, development, integration, and operation of complex systems for space, air, ocean, or ground environment. These systems include, but are not limited to, navigation, avionics, spacecraft, aerospace power, radar, sonar, telemetry, defense, transportation, automated testing, and command and control.