Monte Carlo source verification of Elekta Synergy for pMLC collimated electron beams

IF 2.8 3区物理与天体物理 Q3 CHEMISTRY, PHYSICAL

Radiation Physics and Chemistry Pub Date : 2024-10-31 DOI:10.1016/j.radphyschem.2024.112359

D. van Eeden, F.C.P. du Plessis

引用次数: 0

Abstract

In previous works, an electron beam source was developed that models its energy spectrum with a Lévy distribution. This source is used in BEAMnrc Monte Carlo simulation. It was benchmarked against water tank measurements for electrons delivered through an applicator collimation system, and it was found to agree with 2%/2 mm. This study uses this electron source further by investigating its ability to simulate electrons collimated by the photon multi-leaf collimators for MERT applications. Simulated and Gafchromic EBT3 depth dose and profile data were compared.

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用于 pMLC 准直电子束的 Elekta Synergy 蒙地卡罗源验证

在以前的工作中，我们开发了一种电子束源，它的能谱模型是莱维分布。BEAMnrc 蒙特卡罗模拟中使用了这种电子束源。根据水箱测量结果，对通过涂抹器准直系统传输的电子进行了基准测试，结果发现与 2%/2 mm 的测量值相吻合。本研究将进一步使用该电子源，研究其模拟光子多叶准直器准直的电子在 MERT 应用中的能力。比较了模拟和 Gafchromic EBT3 的深度剂量和剖面数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Radiation Physics and Chemistry 化学-核科学技术

CiteScore

5.60

自引率

17.20%

发文量

574

审稿时长

12 weeks

期刊介绍： Radiation Physics and Chemistry is a multidisciplinary journal that provides a medium for publication of substantial and original papers, reviews, and short communications which focus on research and developments involving ionizing radiation in radiation physics, radiation chemistry and radiation processing. The journal aims to publish papers with significance to an international audience, containing substantial novelty and scientific impact. The Editors reserve the rights to reject, with or without external review, papers that do not meet these criteria. This could include papers that are very similar to previous publications, only with changed target substrates, employed materials, analyzed sites and experimental methods, report results without presenting new insights and/or hypothesis testing, or do not focus on the radiation effects.