A Miniaturized SISL Bandpass Filter Based on Deep Hole Drilling Capacitor

IF 1 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

Microwave and Optical Technology Letters Pub Date : 2024-11-15 DOI:10.1002/mop.70027

Yun-Yang Xu, Yi-Hao Ma, Qi Qiang Liu, Yue Hu, Jing Wang, Wen-Sheng Zhao

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引用次数: 0

Abstract

In this paper, a quasi-lumped element-based bandpass filter is implemented by substrate-integrated suspended line (SISL) technology. To miniaturize the filter size, a deep hole drilling capacitor (DHDC) structure is proposed. The properties of DHDC are derived by parametric analysis and equivalent circuit analysis. Based on derived properties, a quasi-lumped element bandpass filter using SISL technology is designed and fabricated. Experimental results demonstrate that the proposed bandpass filter achieves the center frequency $f_{0}$ of 1.48 GHz, with a fractional bandwidth of 50%. The minimum insertion loss within the passband is 0.96 dB, while the return loss exceeds 23.14 dB. The maximum out-of-band suppression is over −50 dB, and the filter size is only 0.172 λ_g× 0.062 λ_g.

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基于深孔钻电容器的微型 SISL 带通滤波器

本文利用基底集成悬浮线（SISL）技术实现了一种基于准块元件的带通滤波器。为了实现滤波器的小型化，本文提出了一种深孔钻孔电容器（DHDC）结构。通过参数分析和等效电路分析得出了 DHDC 的特性。根据推导出的特性，利用 SISL 技术设计并制造了一个准块元件带通滤波器。实验结果表明，所提出的带通滤波器的中心频率 f 0 ${{\boldsymbol{f}}}_{{{\boldsymbol{0}}}$ 为 1.48 GHz，分数带宽为 50%。通带内的最小插入损耗为 0.96 dB，回波损耗超过 23.14 dB。最大带外抑制超过 -50 dB，滤波器尺寸仅为 0.172 λg × 0.062 λg。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Microwave and Optical Technology Letters 工程技术-工程：电子与电气

CiteScore

3.40

自引率

20.00%

发文量

371

审稿时长

4.3 months

期刊介绍： Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas. - RF, Microwave, and Millimeter Waves - Antennas and Propagation - Submillimeter-Wave and Infrared Technology - Optical Engineering All papers are subject to peer review before publication