Development of a Broadband high-resolution X-ray spectrometer with new toroidally bent crystal

Abstract

X-ray diagnosis technology based on crystal diffraction is an important method to obtain key parameters in the research fields of X-ray spectroscopy diagnosis, material analysis and structural characterization on high-energy laser devices and synchrotron radiation devices. A Broadband high-resolution X-ray crystal spectrometer is proposed and built based on the principle of Rowland-Circle. This spectrometer is designed for measuring X-ray spectra across a wide spectral range(7.6keV–8.5 keV). The structure includes incorporating a curved quartz crystal as the diffraction and focusing element, along with an CMOS photon detector for spectrum detection from a Cu target X-ray tube. Experimental findings indicate that the X-ray crystal spectrometer can achieve spectral energy detection of 8027.8 eV(Kα2) and 8047.8eV (Kα1), the spectrometer's actual spectral resolution can exceed 2718@ Cu Kα1.