A Feature Prefusion and Mask-Guided Network for Camera Decoration Defect Detection

IF 5.6 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Hui Wang;Yuqian Zhao;Fan Zhang;Gui Gui;Qiwu Luo;Chunhua Yang;Weihua Gui
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引用次数: 0

Abstract

Camera decoration is an important part of smartphone. To achieve fully automated production, a dependable, efficient, and automatic method is required for camera decoration surface defect detection. This article presents a detection scheme based on computer vision to improve the efficiency of screening defective products. Since there is no available dataset for method designing in camera decoration field, we establish a camera decoration defect dataset CD3 including 9417 samples with four types of defects. To increase sample size and alleviate category imbalance of CD3, we provide a dataset enhancing framework including a defect copy method and a background reuse method to generate an enhanced dataset CD3_En containing 39649 samples. Besides, a feature fusion and mask-guided network (FMN) including a feature prefusion (FPF) module and a multistage fusion (MSF) module is proposed to screen the defective products. The FPF is constructed by receptive field blocks (RFBs) and information diffusions (IDs), and it can achieve data volume reduction and context enhancement after being embedded between the BoneNet and Neck. The MSF is used as the Neck to realize a two-step feature fusion for predicting the bounding boxes of defects and their masks. The experimental results on the CD3_En dataset demonstrate the superiority of the proposed method compared with other 11 classic object detection methods.
用于摄像头装饰缺陷检测的特征预融合和掩码引导网络
摄像头装饰是智能手机的重要组成部分。为实现全自动化生产,需要一种可靠、高效、自动的方法来检测摄像头装饰表面缺陷。本文提出了一种基于计算机视觉的检测方案,以提高筛选缺陷产品的效率。由于在照相机装饰领域没有可用的数据集用于方法设计,我们建立了一个照相机装饰缺陷数据集 CD3,其中包括 9417 个具有四种类型缺陷的样品。为了增加样本量并缓解 CD3 的类别不平衡问题,我们提供了一个数据集增强框架,包括缺陷复制方法和背景重用方法,生成了一个包含 39649 个样本的增强数据集 CD3_En。此外,我们还提出了一种特征融合和掩码引导网络(FMN),包括特征预融合(FPF)模块和多级融合(MSF)模块,用于筛选缺陷产品。FPF 由感受野块(RFB)和信息扩散(ID)构建,嵌入 BoneNet 和 Neck 之间后可实现数据量减少和上下文增强。MSF 作为 Neck,实现了预测缺陷边界框及其掩膜的两步特征融合。在 CD3_En 数据集上的实验结果表明,与其他 11 种经典的物体检测方法相比,所提出的方法更有优势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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