Multi-bit error detection and correction technique using HVDK (Horizontal-Vertical-Diagonal-Knight) parity

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Abdul Aziz , Md. Asaf-uddowla Golap , Md. Rahat Ebne Alamgir Porosh , Md. Tasnimul Khair Tousif , Muhammad Sheikh Sadi
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引用次数: 0

Abstract

In a data stream, errors are quite likely to occur and sometimes this is much more terrible. So, data safety is very important in digital systems, especially in critical and real-time systems, microprocessors, embedded systems, computer memory, and data communication. The probability of soft error increases with the exponential rate of increasing transistor per chip, operational voltage, particle strike, condensation of bit-cell area, etc. To ensure data integrity, safety, and system reliability, error detection, and correction are fundamental components of data transmission and storage systems. Existing error correction techniques can solve several bits of error. However, these existing methods are not fully efficient, as some consume a lot of time, space, and bit overhead. An ideal approach will have the potential to minimize all of these parameters. This research paper proposes a novel error correction approach with horizontal, vertical, diagonal, and knight (HVDK) parity bits. This approach has been taken to correct 5-bit errors in 64 bits of data word using the parity-based technique with less bit overhead. Our research advances the knowledge of error correction methods and sheds light on how to pick and use parity bit schemes that are appropriate for different applications.
使用 HVDK(水平-垂直-对角-骑士)奇偶校验的多比特错误检测和纠正技术
在数据流中,发生错误的可能性很大,有时甚至更为可怕。因此,数据安全在数字系统中非常重要,尤其是在关键和实时系统、微处理器、嵌入式系统、计算机内存和数据通信中。随着每芯片晶体管、工作电压、粒子撞击、位元面积浓缩等指数级速度的增加,软错误的概率也在增加。为确保数据完整性、安全性和系统可靠性,错误检测和纠正是数据传输和存储系统的基本组成部分。现有的纠错技术可以解决几个比特的错误。然而,这些现有的方法并不完全有效,因为有些方法需要消耗大量的时间、空间和比特开销。一种理想的方法有可能将所有这些参数降到最低。本研究论文提出了一种采用水平、垂直、对角和骑士(HVDK)奇偶校验位的新型纠错方法。该方法采用基于奇偶校验的技术,以较低的位开销纠正 64 位数据字中的 5 位错误。我们的研究增进了对纠错方法的了解,并阐明了如何选择和使用适合不同应用的奇偶校验位方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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