Correlative X-ray micro-nanotomography with scanning electron microscopy at the Advanced Light Source.

IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-11-01 Epub Date: 2024-10-29 DOI:10.1107/S1600577524009305
Arun J Bhattacharjee, Harrison P Lisabeth, Dilworth Parkinson, Alastair MacDowell
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引用次数: 0

Abstract

Geological samples are inherently multi-scale. Understanding their bulk physical and chemical properties requires characterization down to the nano-scale. A powerful technique to study the three-dimensional microstructure is X-ray tomography, but it lacks information about the chemistry of samples. To develop a methodology for measuring the multi-scale 3D microstructure of geological samples, correlative X-ray micro- and nanotomography were performed on two rocks followed by scanning electron microscopy with energy-dispersive spectroscopy (SEM-EDS) analysis. The study was performed in five steps: (i) micro X-ray tomography was performed on rock sample cores, (ii) samples for nanotomography were prepared using laser milling, (iii) nanotomography was performed on the milled sub-samples, (iv) samples were mounted and polished for SEM analysis and (v) SEM imaging and compositional mapping was performed on micro and nanotomography samples for complimentary information. Correlative study performed on samples of serpentine and basalt revealed multiscale 3D structures involving both solid mineral phases and pore networks. Significant differences in the volume fraction of pores and mineral phases were also observed dependent on the imaging spatial resolution employed. This highlights the necessity for the application of such a multiscale approach for the characterization of complex aggregates such as rocks. Information acquired from the chemical mapping of different phases was also helpful in segmentation of phases that did not exhibit significant contrast in X-ray imaging. Adoption of the protocol used in this study can be broadly applied to 3D imaging studies being performed at the Advanced Light Source and other user facilities.

先进光源的 X 射线显微纳米层析技术与扫描电子显微镜的相关性。
地质样本本质上是多尺度的。要了解它们的整体物理和化学特性,就必须对其进行纳米尺度的表征。研究三维微观结构的强大技术是 X 射线层析成像技术,但它缺乏样品的化学信息。为了开发一种测量地质样品多尺度三维微观结构的方法,对两块岩石进行了相关的 X 射线微观和纳米层析成像,然后进行了扫描电子显微镜和能量色散光谱分析(SEM-EDS)。研究分五个步骤进行:(i) 对岩石样本岩心进行微 X 射线层析成像;(ii) 使用激光铣削法制备纳米层析成像样本;(iii) 对铣削后的子样本进行纳米层析成像;(iv) 对样本进行安装和抛光,以便进行扫描电子显微镜分析;(v) 对微观和纳米层析成像样本进行扫描电子显微镜成像和成分绘图,以获得补充信息。对蛇纹岩和玄武岩样品进行的相关研究显示了涉及固体矿物相和孔隙网络的多尺度三维结构。根据所采用的成像空间分辨率,还观察到孔隙和矿物相的体积分数存在显著差异。这凸显了应用这种多尺度方法表征岩石等复杂聚集体的必要性。从不同物相的化学图谱中获取的信息也有助于对 X 射线成像中对比度不明显的物相进行细分。本研究采用的方案可广泛应用于先进光源和其他用户设施正在进行的三维成像研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Synchrotron Radiation
Journal of Synchrotron Radiation INSTRUMENTS & INSTRUMENTATIONOPTICS&-OPTICS
CiteScore
5.60
自引率
12.00%
发文量
289
审稿时长
1 months
期刊介绍: Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.
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