{"title":"Thermal Properties of Multi-Junction Cascade Vertical Cavity Surface Emitting Lasers","authors":"Xiaoli Zhou;Yinuo Wang;Meng Xun;Guanzhong Pan;Yun Sun;Runze Zhang;Weichao Wu;Song Wu;Yongming Fei;Xiaowei Jiang;Dexin Wu","doi":"10.1109/TED.2024.3456769","DOIUrl":null,"url":null,"abstract":"Multi-junction cascade vertical cavity surface emitting lasers (VCSELs) exhibit a noteworthy thermal issue because of their multiple active regions. We have designed and fabricated two six-junction cascade VCSELs with different oxide layers. The light-current–voltage (L–I–V) and divergence angle characteristics, as well as their thermal properties at various ambient temperatures, were analyzed to investigate the thermal problems. Based on the relationship between the emission spectra and power dissipation, we were able to obtain the corresponding thermal resistance values and active region temperatures of different structures afterward. It turned out that the multi-junction cascade VCSELs with multioxide layers have evident advantages of slope efficiency (SE) and optical output power over those with a single-oxide layer due to excellent current and optical confinement. However, owing to the low thermal conductivity of the oxide layers, it is difficult for the heat generated in the active regions to transfer to the surrounding area, resulting in an increase in the thermal resistance of multioxide VCSELs. Meanwhile, the divergence angle of multioxide VCSELs becomes larger because of the strong optical confinement. For better insight, a heat diffusion model of these two devices was established, and the temperature distribution was analyzed. Both the simulation and experimental results agreed fairly well.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"71 11","pages":"6831-6837"},"PeriodicalIF":2.9000,"publicationDate":"2024-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10691944/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Multi-junction cascade vertical cavity surface emitting lasers (VCSELs) exhibit a noteworthy thermal issue because of their multiple active regions. We have designed and fabricated two six-junction cascade VCSELs with different oxide layers. The light-current–voltage (L–I–V) and divergence angle characteristics, as well as their thermal properties at various ambient temperatures, were analyzed to investigate the thermal problems. Based on the relationship between the emission spectra and power dissipation, we were able to obtain the corresponding thermal resistance values and active region temperatures of different structures afterward. It turned out that the multi-junction cascade VCSELs with multioxide layers have evident advantages of slope efficiency (SE) and optical output power over those with a single-oxide layer due to excellent current and optical confinement. However, owing to the low thermal conductivity of the oxide layers, it is difficult for the heat generated in the active regions to transfer to the surrounding area, resulting in an increase in the thermal resistance of multioxide VCSELs. Meanwhile, the divergence angle of multioxide VCSELs becomes larger because of the strong optical confinement. For better insight, a heat diffusion model of these two devices was established, and the temperature distribution was analyzed. Both the simulation and experimental results agreed fairly well.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.