Atomic force microscopy wide-field scanning imaging using homography matrix optimization

IF 2.5 3区工程技术 Q1 MICROSCOPY

Micron Pub Date : 2024-10-18 DOI:10.1016/j.micron.2024.103730

Liguo Tian , Lanjiao Liu , Zihe Liu , Liqun Cheng , Hongmei Xu , Yujuan Chen , Zuobin Wang , Jingran Zhang

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引用次数: 0

Abstract

During the offline combination of multiple atomic force microscopy (AFM) images, changes in probe displacement can be affected by dynamic noise, leading to dislocation and tearing in the stitching. To overcome this, we designed a homography matrix optimization method to describe the relative positional relationship between images by constructing the original image matrix and applying singular value decomposition to denoise the homography matrix. Additionally, we implemented a scale-invariant feature transform (SIFT) to extract feature points. To verify the effectiveness of this method, the SIFT + RANSAC (R), SIFT + affine transformation (AT), and oriented FAST and rotated BRIEF (ORB) algorithms were compared with the proposed algorithm. The experimental results demonstrate that the proposed method precisely computes the transformation matrix, thereby guaranteeing the geometric consistency of mosaic imaging. The proposed method preserves the intricate details of the original image and enhances the stitching quality of wide-field images.

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利用同构矩阵优化技术进行原子力显微镜宽视场扫描成像。

在离线组合多幅原子力显微镜（AFM）图像的过程中，探针位移的变化可能会受到动态噪声的影响，从而导致拼接中的错位和撕裂。为了克服这一问题，我们设计了一种同构矩阵优化方法，通过构建原始图像矩阵并应用奇异值分解对同构矩阵进行去噪，来描述图像之间的相对位置关系。此外，我们还采用了尺度不变特征变换（SIFT）来提取特征点。为了验证这种方法的有效性，我们将 SIFT + RANSAC (R)、SIFT + 仿射变换 (AT) 以及定向 FAST 和旋转 BRIEF (ORB) 算法与所提出的算法进行了比较。实验结果表明，所提出的方法能精确计算变换矩阵，从而保证了马赛克成像的几何一致性。提出的方法保留了原始图像的复杂细节，提高了宽视场图像的拼接质量。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Micron 工程技术-显微镜技术

CiteScore

4.30

自引率

4.20%

发文量

100

审稿时长

31 days

期刊介绍： Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.