Application of x-ray energy dispersive spectroscopy to analyzing the thickness of diamond-like carbon film deposited on the surface of microparticles.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
Junping Zhao, Zhengjie An, Zhijun Ai, Zhicheng Wu, Qiaogen Zhang
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引用次数: 0

Abstract

Depositing diamond-like carbon (DLC) film is considered to be more promising for surface modification of microparticles. The development of reliable and precise measurement techniques for DLC coatings on microparticles is crucial for advancing research in this field. This paper introduces a methodological approach for quantifying the thickness of the film on microparticles. The thickness of the film is obtained by establishing the quantitative relationship between the energy lost when electrons pass through the film and the thickness of the film. The proposed method allows for the estimation of film thickness by assessing solely the elemental abundance on the particle surfaces.

应用 X 射线能量色散光谱分析微粒表面沉积的类金刚石碳膜厚度。
沉积类金刚石碳(DLC)薄膜被认为是更有前景的微颗粒表面改性方法。开发可靠、精确的微颗粒 DLC 涂层测量技术对于推进该领域的研究至关重要。本文介绍了一种量化微颗粒上薄膜厚度的方法。通过建立电子穿过薄膜时损失的能量与薄膜厚度之间的定量关系,可以获得薄膜的厚度。所提议的方法允许仅通过评估微粒表面的元素丰度来估算薄膜厚度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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