14C AMS measurement of CO2 samples with the high throughput HVE gas interface system

IF 2 3区地球科学 Q2 GEOCHEMISTRY & GEOPHYSICS

Radiocarbon Pub Date : 2024-09-18 DOI:10.1017/rdc.2024.60

G Scognamiglio, M Klein, A Stolz, R Walet, D Mous

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Abstract

The newly designed HVE gas interface enables the AMS measurement of carbon samples in CO2 form. The CO2, e.g. resulting from the sample combustion in an elemental analyzer, is adsorbed in a zeolite trap and subsequently transferred to a motor-driven syringe. Once diluted with He, the gas mixture is transferred into the ion source of the AMS system. A carbon ion beam is formed in the ion source and mass-analyzed by the AMS system, resulting in 13C/12C and 14C/12C isotopic ratios. The HVE gas interface features two traps and two syringes to maximize the sample throughput, which results in more than 10 samples per hour. The first performance results of CO2 gas sample AMS measurements that were performed with the HVE gas interface in combination with the HVE 210 kV AMS system are presented in this paper. The measurements show that the gas interface contribution to the 14C/12C background is in the 10–15 level and to the precision is at or below 1%.

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利用高通量 HVE 气体接口系统对二氧化碳样品进行 14C AMS 测量

新设计的 HVE 气体接口可对二氧化碳形式的碳样品进行 AMS 测量。二氧化碳（例如在元素分析仪中样品燃烧产生的二氧化碳）被吸附在沸石捕集器中，随后被输送到电机驱动的注射器中。用 He 稀释后，气体混合物被转移到 AMS 系统的离子源中。碳离子束在离子源中形成，由 AMS 系统进行质量分析，得出 13C/12C 和 14C/12C 同位素比值。HVE 气体接口具有两个捕集器和两个注射器，可最大限度地提高样品吞吐量，每小时可采集 10 多个样品。本文介绍了使用 HVE 气体界面结合 HVE 210 kV AMS 系统进行的二氧化碳气体样品 AMS 测量的首批性能结果。测量结果表明，气体界面对 14C/12C 背景的贡献在 10-15 级，对精度的贡献在 1%或以下。

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来源期刊

Radiocarbon 地学-地球化学与地球物理

CiteScore

16.20

自引率

6.00%

发文量

审稿时长

6-12 weeks

期刊介绍： Radiocarbon serves as the leading international journal for technical and interpretive articles, date lists, and advancements in 14C and other radioisotopes relevant to archaeological, geophysical, oceanographic, and related dating methods. Established in 1959, it has published numerous seminal works and hosts the triennial International Radiocarbon Conference proceedings. The journal also features occasional special issues. Submissions encompass regular articles such as research reports, technical descriptions, and date lists, along with comments, letters to the editor, book reviews, and laboratory lists.