Using magneto-optical effects in soft X-ray reflectivity to study current driven magnetization reversal

Abstract

The soft X-ray reflectivity technique is frequently utilized for studying magnetization reversal in thin films due to its elemental and depth sensitivity. The characteristic hysteresis loops measured with this technique are dependent on both the magnetization direction in magnetic materials and the incident soft X-ray polarization. In this note, we have discussed these magneto-optical effects in soft X-ray reflectivity measurements. These effects can be exploited to probe magnetization reversal mechanisms driven by stimuli beyond conventional means of magnetic field. To demonstrate this, we have presented our investigations on current-induced magnetization switching in ferromagnet (FM)/heavy metal(HM) heterostructures.