{"title":"Ferroelectric Properties of Heterostructure Sr0.5Ba0.5Nb2O6/Ba0.2Sr0.8TiO3/Si(001)","authors":"D. A. Kiselev, A. V. Pavlenko, S. P. Zinchenko","doi":"10.1134/s1063785023180050","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>The properties of <b><i>c</i></b>-oriented thin films of Sr<sub>0.5</sub>Ba<sub>0.5</sub>Nb<sub>2</sub>O<sub>6</sub> grown on a Si(001) (<i>p</i>-type) substrate with a pre-deposited Ba<sub>0.2</sub>Sr<sub>0.8</sub>TiO<sub>3</sub> layer were studied using scanning probe microscopy and dielectric spectroscopy. It is established that the Sr<sub>0.5</sub>Ba<sub>0.5</sub>Nb<sub>2</sub>O<sub>6</sub> films are characterized by low surface roughness (less than 6 nm) and average crystallite size of ~93 nm. It is shown that there is spontaneous polarization in the film directed from its surface to the substrate, which causes the manifestation of the field effect for the case of the Si substrate with <i>p</i>-type conductivity without the external field effect. Differences in the magnitudes of the surface potential signal for regions polarized by an external electric field of different polarities (+10 and –10 V), as well as in their relaxation to the initial state, are revealed. The reasons for the established patterns are discussed.</p>","PeriodicalId":784,"journal":{"name":"Technical Physics Letters","volume":null,"pages":null},"PeriodicalIF":0.8000,"publicationDate":"2024-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Physics Letters","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1134/s1063785023180050","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
The properties of c-oriented thin films of Sr0.5Ba0.5Nb2O6 grown on a Si(001) (p-type) substrate with a pre-deposited Ba0.2Sr0.8TiO3 layer were studied using scanning probe microscopy and dielectric spectroscopy. It is established that the Sr0.5Ba0.5Nb2O6 films are characterized by low surface roughness (less than 6 nm) and average crystallite size of ~93 nm. It is shown that there is spontaneous polarization in the film directed from its surface to the substrate, which causes the manifestation of the field effect for the case of the Si substrate with p-type conductivity without the external field effect. Differences in the magnitudes of the surface potential signal for regions polarized by an external electric field of different polarities (+10 and –10 V), as well as in their relaxation to the initial state, are revealed. The reasons for the established patterns are discussed.
期刊介绍：
Technical Physics Letters is a companion journal to Technical Physics and offers rapid publication of developments in theoretical and experimental physics with potential technological applications. Recent emphasis has included many papers on gas lasers and on lasing in semiconductors, as well as many reports on high Tc superconductivity. The excellent coverage of plasma physics seen in the parent journal, Technical Physics, is also present here with quick communication of developments in theoretical and experimental work in all fields with probable technical applications. Topics covered are basic and applied physics; plasma physics; solid state physics; physical electronics; accelerators; microwave electron devices; holography.
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