Exact stark analytical function for Hα line based on the FFM model related with plasma parameters

IF 3.2 2区 化学 Q1 SPECTROSCOPY
A. Sarsa , A. Jiménez-Solano , M.S. Dimitrijević , C. Yubero
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引用次数: 0

Abstract

Optical Emission Spectroscopy is a widely used technique for plasma diagnosis, with particular interest in hydrogen atomic emission due to its prevalence in plasmas. However, accurately determining plasma parameters like electron density, electron temperature, and gas temperature starting from the experimental profiles remains a challenge. This paper introduces a comprehensive model for Stark broadening of the Hα line in a wide range of plasma conditions, addressing the limitations of existing analytical expressions for line shapes. The proposed model encompasses the full splitting of the transition into fifteen Lorentzian profiles and electric micro-field fluctuations surrounding the emitting atoms due to collisions with charged particles. Starting from accurate spectral data obtained from realistic computer simulations, fitting parameters of the model, have been obtained by using an optimization method based on a genetic algorithm. The set of parameters of the model are reported for a wide range of plasma conditions. The behavior of these parameters is analyzed to understand their dependence in terms of the electron density and temperature and gas density of the plasma. The model parameters here obtained constitute a useful tool in plasma diagnosis to obtaining the values of the physical parameters of the plasma starting from the experimental profiles.

Abstract Image

基于与等离子体参数相关的 FFM 模型的 Hα 线精确斯塔克分析函数
光学发射光谱是一种广泛应用于等离子体诊断的技术,由于氢原子发射在等离子体中非常普遍,因此人们对它尤其感兴趣。然而,根据实验剖面精确确定电子密度、电子温度和气体温度等等离子体参数仍然是一项挑战。本文针对现有的线形分析表达式的局限性,介绍了在各种等离子体条件下 Hα 线斯塔克展宽的综合模型。所提出的模型包含了过渡到 15 个洛伦兹剖面的全部分裂,以及发射原子周围由于与带电粒子碰撞而产生的电微场波动。从现实计算机模拟获得的精确光谱数据出发,利用基于遗传算法的优化方法获得了模型的拟合参数。该模型的参数集适用于多种等离子体条件。对这些参数的行为进行了分析,以了解它们与等离子体的电子密度、温度和气体密度的关系。所获得的模型参数是等离子体诊断中的一个有用工具,可用于根据实验剖面获得等离子体的物理参数值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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