Calibrating Fluorescence Microscopy With 3D-Speckler (3D Fluorescence Speckle Analyzer).

IF 1 Q3 BIOLOGY
Chieh-Chang Lin, Aussie Suzuki
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引用次数: 0

Abstract

Fluorescence microscopy has been widely accessible and indispensable in cell biology research. This technique enables researchers to label targets, ranging from individual entities to multiple groups, with fluorescent markers. It offers precise determinations of localization, size, and shape, along with accurate quantifications of fluorescence signal intensities. Furthermore, an ideal fluorescence microscope can achieve approximately 250 nm in lateral and 600 nm in axial resolution. Despite its integral role in these measurements, the calibration of fluorescence microscopes is often overlooked. This protocol introduces the use of 3D-Speckler (3D fluorescence speckle analyzer), a semi-automated software tool we have recently developed, for calibrating fluorescence microscopy. Calibration of fluorescence microscopy includes determining resolution limits, validating accuracy in size measurements, evaluating illumination flatness, and determining chromatic aberrations. 3D-Speckler is user-friendly and enables precise quantification of fluorescence puncta, including nanoscale 2D/3D particle size, precise locations, and intensity information. By utilizing multispectral fluorescence beads of known sizes alongside 3D-Speckler, the software can effectively calibrate imaging systems. We emphasize the importance of routine calibration for imaging systems to maintain their integrity and reproducibility, ensuring accurate quantification. This protocol provides a detailed step-by-step guide on using 3D-Speckler to calibrate imaging systems. Key features • Semi-automated particle detection. • Accurate three-dimensional measurement of fluorescent particle sizes. • High-precision three-dimensional localization of fluorescent particles. • Precision analysis of point spread function and chromatic aberration in fluorescence microscopy.

利用 3D-Speckler (三维荧光斑点分析仪)校准荧光显微镜。
在细胞生物学研究中,荧光显微镜已被广泛使用,而且不可或缺。这项技术使研究人员能够用荧光标记标记从单个实体到多个群体的目标。它能精确测定定位、大小和形状,并准确量化荧光信号强度。此外,理想的荧光显微镜可达到约 250 纳米的横向分辨率和 600 纳米的轴向分辨率。尽管荧光显微镜的校准在这些测量中发挥着不可或缺的作用,但却经常被忽视。本方案介绍了如何使用我们最近开发的半自动软件工具 3D-Speckler (三维荧光斑点分析仪)来校准荧光显微镜。荧光显微镜的校准包括确定分辨率极限、验证尺寸测量的准确性、评估照明平整度和确定色差。3D-Speckler 用户界面友好,可对荧光点进行精确量化,包括纳米级 2D/3D 颗粒大小、精确位置和强度信息。利用已知尺寸的多光谱荧光珠和 3D-Speckler 软件,可以有效校准成像系统。我们强调对成像系统进行常规校准的重要性,以保持其完整性和可重复性,确保准确量化。本协议提供了使用 3D-Speckler 校准成像系统的详细分步指南。主要特点 - 半自动颗粒检测。- 精确的三维荧光颗粒尺寸测量。- 荧光颗粒的高精度三维定位。- 精确分析荧光显微镜中的点扩散函数和色差。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
1.50
自引率
0.00%
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0
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