Error Minimization in PV Characterization When Using Unfiltered Light Sources

Abstract

This study introduces a novel methodology for the accurate characterization of photovoltaic (PV) devices that are using spectral distributions from various unfiltered light sources, including ASTM G173-03 solar irradiance, xenon arc lamp, metal halide lamp and tungsten halogen lamp within the 300–1300 nm wavelength range. By leveraging experimental values of external quantum efficiencies and open circuit voltages from nine distinct solar cell technologies, the authors calculated efficiencies with minimal deviation from the experimental benchmarks. The approach uniformly applies across all light sources, revealing a significant correlation between the power and spectrum of light sources that mitigates their spectral influence on solar cell output parameters. This work not only advances the understanding of light source effects on PV device performance but also proposes a correction methodology that significantly reduces evaluation errors, providing a pathway towards more accurate and cost-effective PV device testing and characterization.