On the Multi-Layered Adsorption of Alkanols in the Vicinity of Liquid–Vapor Transition at the Saturated Hydrocarbon/Water Interface

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
A. M. Tikhonov, Yu. O. Volkov
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引用次数: 0

Abstract

Structure of the adsorption layer of unsaturated monoatomic alcohols, 1-dodecanol and 1‑tetracosanol, at n-hexane/water and n-hexadecane/water interfaces, respectively, in the vicinity of liquid–vapor thermotropic phase transition is investigated by the method of X-ray reflectometry with a synchrotron source. Model-independent structural data obtained on the adsorption layers under investigation deviate considerably from the structural parameters that have been previously proposed within a model-based approach and discussed for the said systems. It is shown that in the low-temperature mesophase the adsorption film consists of a Gibbs monolayer, a liquid transition region with thickness of two to three monolayers ~50 Å, and an extended (wide up to 200 Å) layer of micelles. Presence of a plane of the closest approach of the micellar layer to the adsorption film at the interface is established. Transition to the high-temperature mesophase is accompanied by liquefying and partial evaporation of the alkanol film along with depletion of the micellar layer down to its complete disappearance.

Abstract Image

Abstract Image

关于饱和碳氢化合物/水界面液-气过渡附近的烷醇多层吸附问题
摘要 在正己烷/水和正十六烷/水界面上,利用同步辐射源的 X 射线反射测量法研究了不饱和单原子醇、1-十二醇和 1-十四醇在液-气热相变附近的吸附层结构。在所研究的吸附层上获得的与模型无关的结构数据大大偏离了之前在基于模型的方法中提出并讨论过的上述系统的结构参数。研究表明,在低温介相中,吸附膜由一个吉布斯单层、一个厚度为 2 到 3 个单层(约 50 Å)的液体过渡区和一个扩展的(宽达 200 Å)胶束层组成。胶束层与界面吸附膜最接近的平面已经确定。向高温介相的过渡伴随着烷醇膜的液化和部分蒸发,以及胶束层的耗竭直至完全消失。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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