Simulation of the Effect of N2O on DNA Damage by Ionizing Radiation

J. Barilla, P. Simr, Květuše Sýkorová
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Abstract

Damage to the DNA molecule by ionizing radiation can be influenced by the presence of certain chemicals in the cell during irradiation. These substances can be both radioprotective and radiosensitive. In this paper, we will discuss the effect of N2O, widely used in medicine, on the chemical stage of the radiobiological mechanism. N2O in the cell during irradiation with ionizing radiation results in more significant damage to the DNA molecule because N2O reacts with hydrated electrons 𝑒𝑎𝑞 − to form aggressive OH radicals. A mathematical simulation model developed using hybrid Petri nets is used to analyze this dynamic process. Hybrid Petri nets allow us to quickly create a mathematical simulation model and explore the system under study to obtain detailed information for practical applications.
模拟 N2O 对电离辐射 DNA 损伤的影响
电离辐射对 DNA 分子的损伤会受到辐照期间细胞中存在的某些化学物质的影响。这些物质既有辐射防护作用,也有辐射敏感性。本文将讨论广泛用于医学的 N2O 对放射生物学机制的化学阶段的影响。在电离辐射照射过程中,细胞中的 N2O 会对 DNA 分子造成更严重的损伤,因为 N2O 会与水合电子发生𝑒𝑎△反应,形成具有侵蚀性的 OH 自由基。我们使用混合 Petri 网开发的数学模拟模型来分析这一动态过程。混合 Petri 网使我们能够快速创建数学模拟模型,并探索所研究的系统,从而获得实际应用的详细信息。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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