Double-exponential-probability-distribution-function and it's applications in some critical aerospace safety problems: Perspective and brief review

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
E. Suhir
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引用次数: 0

Abstract

Some critical microelectronics and photonics aerospace-safety and reliability-physics problems could be successfully addressed using a flexible and physically meaningful double-exponential-probability-distribution-function (DEPDF). It is the author's belief that a successful outcome of an undertaking of importance cannot be achieved and assured, nor even considerably improved, if the effort is not quantified, and if, because of numerous uncertain-and-inevitable intervening influences, such a quantification is not done on a probabilistic basis. This is particularly true in various “human-in-the-loop” missions and extraordinary situations, when the reliability of the equipment/instrumentation, both its hard- and software, and the performance of the involved human(s) contribute jointly to the outcome of a mission or an off-normal situation. The acceptable never-zero probability of failure cannot be high, of course, but should not be lower than necessary either. It has to be adequate for a particular system, mission and application. Products that “never fail” are most likely more expensive than they could and should be. The general concepts are illustrated by practical examples. It is concluded that while some kind of predictive modeling should always precede any type of accelerated testing, analytical (“mathematical”) modeling, employed in this write-up, should complement, whenever possible, computer simulations: these two major modeling tools are based on different assumptions, use different calculation techniques, and if the results are in agreement, then there is a good reason to believe that the obtained information is sufficiently accurate and, hence, trustworthy. Future work should be focused on the experimental verification of the suggested DEPDF model and on new areas of its possible applications in aerospace safety tasks and problems and beyond.

双指数概率分布函数及其在一些关键航空航天安全问题中的应用:视角与简要回顾
一些关键的微电子学和光子学航空航天安全与可靠性物理问题,可以利用灵活且具有物理意义的双指数概率分布函数(DEPDF)来成功解决。作者认为,如果不对工作进行量化,而且由于存在许多不确定和不可避免的干扰影响因素,如果不在概率基础上进行量化,就无法实现和确保一项重要工作的成功,甚至无法大大改进工作。这一点在各种 "人在回路 "任务和特殊情况下尤为明显,因为设备/仪器的可靠性(包括硬件和软件)以及相关人员的表现会共同影响任务或非正常情况的结果。当然,可接受的永远不为零的故障概率不能太高,但也不能低于必要的水平。它必须足以满足特定系统、任务和应用的需要。那些 "永不失效 "的产品很可能比它们本应具备的性能更加昂贵。我们通过实际例子对一般概念进行了说明。结论是,虽然在进行任何类型的加速测试之前都应先进行某种预测建模,但在可能的情况下,本文所采用的分析("数学")建模应作为计算机模拟的补充:这两种主要建模工具基于不同的假设,使用不同的计算技术,如果结果一致,则有充分理由相信所获得的信息足够准确,因而值得信赖。未来的工作重点是对建议的 DEPDF 模型进行实验验证,并将其应用于航空航天安全任务和问题等新领域。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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