{"title":"A Current Calibration Circuit for a 14-Bit Column-Parallel Dual-Ramp Single-Slope ADC in Infrared Image Sensors","authors":"Omer Lutfi Nuzumlalı;Tufan Coskun Karalar","doi":"10.1109/TCSII.2024.3425595","DOIUrl":null,"url":null,"abstract":"This brief introduces a current calibration circuit that is specifically designed for use in a column-parallel Dual-Ramp Single-Slope (DRSS) ADC. This circuit creates two current sources with a precise current ratio. These currents are then used in coarse and fine conversion stages. The desired current ratio can be achieved by adjusting the integration times based on standard clock sources in typical CMOS circuits. A 14-bit DRSS ADC that utilizes this calibration technique has been implemented in a \n<inline-formula> <tex-math>$0.18~\\mu $ </tex-math></inline-formula>\n m CMOS technology to be used in an Infrared Detector (IR) Read-Out Integrated Circuit (ROIC). Experiments demonstrate that a DNL error smaller than ±0.4 LSB is successfully achieved when the current calibration circuit is active.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"71 12","pages":"4824-4828"},"PeriodicalIF":4.0000,"publicationDate":"2024-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems II: Express Briefs","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10589566/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This brief introduces a current calibration circuit that is specifically designed for use in a column-parallel Dual-Ramp Single-Slope (DRSS) ADC. This circuit creates two current sources with a precise current ratio. These currents are then used in coarse and fine conversion stages. The desired current ratio can be achieved by adjusting the integration times based on standard clock sources in typical CMOS circuits. A 14-bit DRSS ADC that utilizes this calibration technique has been implemented in a
$0.18~\mu $
m CMOS technology to be used in an Infrared Detector (IR) Read-Out Integrated Circuit (ROIC). Experiments demonstrate that a DNL error smaller than ±0.4 LSB is successfully achieved when the current calibration circuit is active.
期刊介绍:
TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes:
Circuits: Analog, Digital and Mixed Signal Circuits and Systems
Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic
Circuits and Systems, Power Electronics and Systems
Software for Analog-and-Logic Circuits and Systems
Control aspects of Circuits and Systems.