Understanding board level vibrations in automotive electronic modules

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
V. Thukral , R. Roucou , C. Chou , J.J.M. Zaal , M. van Soestbergen , R.T.H. Rongen , W.D. van Driel , G.Q. Zhang
{"title":"Understanding board level vibrations in automotive electronic modules","authors":"V. Thukral ,&nbsp;R. Roucou ,&nbsp;C. Chou ,&nbsp;J.J.M. Zaal ,&nbsp;M. van Soestbergen ,&nbsp;R.T.H. Rongen ,&nbsp;W.D. van Driel ,&nbsp;G.Q. Zhang","doi":"10.1016/j.microrel.2024.115430","DOIUrl":null,"url":null,"abstract":"<div><p>Board level reliability can be of high interest for automotive electronic components when exposed to vibration-prone environments. However, the absence of an industry standard for board level vibration testing poses several challenges in establishing a well-characterized test setup. One of the challenges is that automotive applications can induce abnormal stresses on components that can lead to early failures in the field. Such loading conditions are not always covered in the current board level vibration test methods. This paper aims to correlate the stresses from automotive modules to board levels by measuring the printed circuit board (PCB) vibration spectrum. Firstly, the study compares and assesses several module board level vibration measurement units, such as LASER Doppler Vibrometer (LDV), strain gauges, and accelerometers. Experiments and simulations show that LDV enables good correlation with Micro-electro Mechanical Systems (MEMS) accelerometers. Secondly, the module-board interaction unveils insights into several module design features that impact the PCB vibration response and solder joint interconnect reliability. These findings underscore the necessity for the user to correctly validate the reliability of packages beyond board level testing, i.e., at the module level. This reliability test approach enables the translation of reliability test results from the lab to the field life of components once built in the final application equipment.</p></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"159 ","pages":"Article 115430"},"PeriodicalIF":1.6000,"publicationDate":"2024-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271424001100","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

Board level reliability can be of high interest for automotive electronic components when exposed to vibration-prone environments. However, the absence of an industry standard for board level vibration testing poses several challenges in establishing a well-characterized test setup. One of the challenges is that automotive applications can induce abnormal stresses on components that can lead to early failures in the field. Such loading conditions are not always covered in the current board level vibration test methods. This paper aims to correlate the stresses from automotive modules to board levels by measuring the printed circuit board (PCB) vibration spectrum. Firstly, the study compares and assesses several module board level vibration measurement units, such as LASER Doppler Vibrometer (LDV), strain gauges, and accelerometers. Experiments and simulations show that LDV enables good correlation with Micro-electro Mechanical Systems (MEMS) accelerometers. Secondly, the module-board interaction unveils insights into several module design features that impact the PCB vibration response and solder joint interconnect reliability. These findings underscore the necessity for the user to correctly validate the reliability of packages beyond board level testing, i.e., at the module level. This reliability test approach enables the translation of reliability test results from the lab to the field life of components once built in the final application equipment.

了解汽车电子模块的板级振动
当汽车电子元件暴露在易振动的环境中时,电路板级可靠性就会受到高度关注。然而,由于缺乏板级振动测试的行业标准,在建立特性良好的测试装置方面面临着诸多挑战。挑战之一是汽车应用会对元件造成异常应力,从而导致现场早期故障。目前的板级振动测试方法并不总是涵盖这种加载条件。本文旨在通过测量印刷电路板(PCB)振动频谱,将汽车模块的应力与电路板级相关联。首先,研究比较并评估了几种模块板级振动测量装置,如激光多普勒振动计 (LDV)、应变仪和加速度计。实验和模拟结果表明,LDV 与微电子机械系统 (MEMS) 加速计具有良好的相关性。其次,模块与电路板的相互作用揭示了影响电路板振动响应和焊点互连可靠性的几个模块设计特征。这些发现强调,用户有必要在电路板级测试之外,即在模块级正确验证封装的可靠性。这种可靠性测试方法可以将实验室的可靠性测试结果转化为最终应用设备中元件的现场寿命。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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