V. Thukral , R. Roucou , C. Chou , J.J.M. Zaal , M. van Soestbergen , R.T.H. Rongen , W.D. van Driel , G.Q. Zhang
{"title":"Understanding board level vibrations in automotive electronic modules","authors":"V. Thukral , R. Roucou , C. Chou , J.J.M. Zaal , M. van Soestbergen , R.T.H. Rongen , W.D. van Driel , G.Q. Zhang","doi":"10.1016/j.microrel.2024.115430","DOIUrl":null,"url":null,"abstract":"<div><p>Board level reliability can be of high interest for automotive electronic components when exposed to vibration-prone environments. However, the absence of an industry standard for board level vibration testing poses several challenges in establishing a well-characterized test setup. One of the challenges is that automotive applications can induce abnormal stresses on components that can lead to early failures in the field. Such loading conditions are not always covered in the current board level vibration test methods. This paper aims to correlate the stresses from automotive modules to board levels by measuring the printed circuit board (PCB) vibration spectrum. Firstly, the study compares and assesses several module board level vibration measurement units, such as LASER Doppler Vibrometer (LDV), strain gauges, and accelerometers. Experiments and simulations show that LDV enables good correlation with Micro-electro Mechanical Systems (MEMS) accelerometers. Secondly, the module-board interaction unveils insights into several module design features that impact the PCB vibration response and solder joint interconnect reliability. These findings underscore the necessity for the user to correctly validate the reliability of packages beyond board level testing, i.e., at the module level. This reliability test approach enables the translation of reliability test results from the lab to the field life of components once built in the final application equipment.</p></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"159 ","pages":"Article 115430"},"PeriodicalIF":1.6000,"publicationDate":"2024-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271424001100","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Board level reliability can be of high interest for automotive electronic components when exposed to vibration-prone environments. However, the absence of an industry standard for board level vibration testing poses several challenges in establishing a well-characterized test setup. One of the challenges is that automotive applications can induce abnormal stresses on components that can lead to early failures in the field. Such loading conditions are not always covered in the current board level vibration test methods. This paper aims to correlate the stresses from automotive modules to board levels by measuring the printed circuit board (PCB) vibration spectrum. Firstly, the study compares and assesses several module board level vibration measurement units, such as LASER Doppler Vibrometer (LDV), strain gauges, and accelerometers. Experiments and simulations show that LDV enables good correlation with Micro-electro Mechanical Systems (MEMS) accelerometers. Secondly, the module-board interaction unveils insights into several module design features that impact the PCB vibration response and solder joint interconnect reliability. These findings underscore the necessity for the user to correctly validate the reliability of packages beyond board level testing, i.e., at the module level. This reliability test approach enables the translation of reliability test results from the lab to the field life of components once built in the final application equipment.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.