Low-background ultrahigh-purity aluminium window for small-angle neutron scattering using monochromatic cold neutrons

IF 5.2 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Takayuki Kumada, Ryuhei Motokawa, Hiroki Iwase
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引用次数: 0

Abstract

The 500 mm-diameter aluminium alloy neutron window in the SANS diffractometer SANS-J at JRR-3, Tokai, Japan, has been replaced by an ultrahigh-purity aluminium (5N-Al, >99.999%) window. Although the 5N-Al window is three times thicker than the alloy window to compensate for the lower tensile strength, the background intensity in the small-angle neutron scattering (SANS) curve was successfully decreased by a factor of 10 at the maximum. The 5N-Al window is suitable not only for large-diameter neutron windows in SANS diffractometers but also for windows in their environmental apparatus which cannot be made of single-crystal silicon or other ceramics due to their poor availability, fracture strength, processability or affinity with metallic materials.

利用单色冷中子进行小角中子散射的低背景超高纯铝窗
日本东海 JRR-3 的 SANS 衍射仪 SANS-J 中直径 500 毫米的铝合金中子窗口已被超高纯铝(5N-Al,>99.999%)窗口取代。虽然 5N-Al 窗口比合金窗口厚三倍,以补偿较低的抗拉强度,但小角中子散射(SANS)曲线中的背景强度在最大值时成功降低了 10 倍。5N-Al 窗口不仅适用于 SANS 衍射仪中的大直径中子窗口,也适用于其环境仪器中的窗口,因为单晶硅或其他陶瓷的可用性、断裂强度、可加工性或与金属材料的亲和性都较差。
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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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