O. P. Ivanova, A. V. Krivandin, A. A. Piryazev, S. A. Zav’yalov
{"title":"Structural Features of Poly(p-Xylylene)−Cadmium Sulfide Nanocomposite Films","authors":"O. P. Ivanova, A. V. Krivandin, A. A. Piryazev, S. A. Zav’yalov","doi":"10.1134/S1027451024020290","DOIUrl":null,"url":null,"abstract":"<p>The structure and chemical composition of nanocomposite films based on poly(<i>p</i>-xylylene) with cadmium sulfide (CdS) as a filler were studied by X-ray diffraction and infrared (IR) spectroscopy. The films were synthesized by the codeposition of <i>p</i>-xylylene monomer and CdS vapors on quartz and silicon substrates, had a thickness of ~0.2 and ~1.5 µm and contained 5–90 vol % of CdS. The effect of the filler content and film thickness on polymer matrix and filler structure was demonstrated. The differences in the chemical compositions of the films with thicknesses of ~0.2 and ~1.5 µm were revealed, caused by their partial oxidation upon contact with air after synthesis. The possible influence of hydroxyl groups on the formation of CdS crystalline structures in films was discussed. A correlation was established between the structural transformations upon changes in the CdS content with the previously obtained dependences of the dark conductivity and photoconductivity for films with a thickness of ~0.2 μm.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 2","pages":"391 - 399"},"PeriodicalIF":0.5000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024020290","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The structure and chemical composition of nanocomposite films based on poly(p-xylylene) with cadmium sulfide (CdS) as a filler were studied by X-ray diffraction and infrared (IR) spectroscopy. The films were synthesized by the codeposition of p-xylylene monomer and CdS vapors on quartz and silicon substrates, had a thickness of ~0.2 and ~1.5 µm and contained 5–90 vol % of CdS. The effect of the filler content and film thickness on polymer matrix and filler structure was demonstrated. The differences in the chemical compositions of the films with thicknesses of ~0.2 and ~1.5 µm were revealed, caused by their partial oxidation upon contact with air after synthesis. The possible influence of hydroxyl groups on the formation of CdS crystalline structures in films was discussed. A correlation was established between the structural transformations upon changes in the CdS content with the previously obtained dependences of the dark conductivity and photoconductivity for films with a thickness of ~0.2 μm.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.