Features of Electron Reflection by a Layer of Carbon Nanotubes

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2024-05-07 DOI:10.1134/s1027451024020162

N. V. Novikov, N. G. Chechenin, A. A. Shirokova

引用次数: 0

Abstract

In this paper, we study the anisotropic properties of a layer of carbon nanotubes upon electron reflection. Only a small proportion of the incident electrons is found to be reflected from a target with a surface layer of oriented carbon nanotubes. Reflection occurs only from a layer of horizontally oriented nanotubes at an incidence angle greater than 80° and vertically oriented nanotubes at an incidence angle less than 10°. The effect is explained by the peculiarities of the formation of an electron flow in the surface layers of the target.

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碳纳米管层的电子反射特征

摘要本文研究了碳纳米管层在电子反射时的各向异性。研究发现，只有一小部分入射电子从表面有定向碳纳米管层的靶上反射。只有入射角大于 80° 的水平定向纳米管层和入射角小于 10° 的垂直定向纳米管才会发生反射。这种效应的原因是电子流在目标表面层形成的特殊性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.

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