Beware of atrial pacing‐induced ventricular depolarization: A case of lead malfunction

Bailing Dai, Wenqing Yin, Chengming Ma, Peipei Ma, Yingqi Wang, Li Hong, Xiaohong Yu, Xiaomeng Yin, Yingxue Dong, Yunlong Xia, Yanzong Yang, Lianjun Gao
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Abstract

Although ventricular capture during the atrial threshold test is possible, there are rare reports on the insulation defect and inactive leads thereof. In this case, we present a pacemaker‐dependent patient with a history of pacemaker generator replacements. The patient experienced ventricular capture induced by atrial pacing due to adhesion of the atrial and ventricular leads with an insulation defect. The atrial lead was abandoned and a new lead was implanted. However, there was a significant decrease in ventricular impedance detected shortly after the new lead was implanted. When observing the phenomenon of atrial pacing‐induced ventricular depolarization, one uncommon reason to consider is lead adhesive wear. It is important to pay attention to the contact and bending sites of the leads.
小心心房起搏诱发心室去极化:一例导联故障
虽然在心房阈值测试中可能会出现心室捕获,但有关绝缘缺陷及其非活动导联的报道并不多见。在本病例中,我们介绍了一位起搏器依赖型患者,曾有起搏器发生器更换史。由于心房和心室导联的粘连和绝缘缺陷,患者在心房起搏时出现了心室俘获。患者放弃了心房导联,并植入了新的导联。然而,在植入新导联线后不久,发现心室阻抗明显下降。在观察心房起搏诱发心室去极化现象时,一个不常见的原因值得考虑,那就是导联粘合剂磨损。重要的是要注意导联的接触和弯曲部位。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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