Diffraction contrast of ferroelectric domains in DPC STEM images.

IF 1.5 4区 工程技术 Q3 MICROSCOPY
Microscopy Pub Date : 2024-04-17 DOI:10.1093/jmicro/dfae019
Masaya Takamoto, T. Seki, Y. Ikuhara, Naoya Shibata
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引用次数: 0

Abstract

Differential phase contrast scanning transmission electron microscopy (DPC STEM) is a powerful technique for directly visualizing electromagnetic fields inside materials at high spatial resolution. Electric field observation within ferroelectric materials is potentially possible by DPC STEM, but concomitant diffraction contrast hinders the quantitative electric field evaluation. Diffraction contrast is basically caused by the diffraction-condition variation inside a field-of-view, but in the case of ferroelectric materials, the diffraction conditions can also change with respect to the polarization orientations. To quantitatively observe electric field distribution inside ferroelectric domains, the formation mechanism of diffraction contrast should be clarified in detail. In this study, we systematically simulated diffraction contrast of ferroelectric domains in DPC STEM images based on the dynamical diffraction theory, and clarify the issues for quantitatively observing electric fields inside ferroelectric domains. Furthermore, we conducted experimental DPC STEM observations for a ferroelectric material to confirm the influence of diffraction contrast predicted by the simulations.
DPC STEM 图像中铁电畴的衍射对比。
差相对比扫描透射电子显微镜(DPC STEM)是一种强大的技术,可直接以高空间分辨率观察材料内部的电磁场。DPC STEM 有可能观察到铁电材料内部的电场,但随之而来的衍射对比阻碍了电场的定量评估。衍射对比度基本上是由视场内的衍射条件变化引起的,但在铁电材料中,衍射条件也会随极化方向的变化而变化。要定量观测铁电畴内的电场分布,就必须详细阐明衍射对比的形成机制。本研究基于动态衍射理论,系统模拟了 DPC STEM 图像中铁电畴的衍射对比,并阐明了定量观测铁电畴内部电场的问题。此外,我们还对一种铁电材料进行了 DPC STEM 实验观测,以证实模拟预测的衍射对比度的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Microscopy
Microscopy Physics and Astronomy-Instrumentation
CiteScore
3.30
自引率
11.10%
发文量
76
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
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