Ray-tracing analytical absorption correction for X-ray crystallography based on tomographic reconstructions

IF 6.1 3区材料科学 Q1 Biochemistry, Genetics and Molecular Biology

Journal of Applied Crystallography Pub Date : 2024-04-15 DOI:10.1107/s1600576724002243

Lu, Y., Duman, R., Beilsten-Edmands, J., Winter, G., Basham, M., Evans, G., Kamps, J.J.A.G., Orville, A.M., Kwong, H.-S., Beis, K., Armour, W., Wagner, A.

引用次数: 0

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基于断层重构的 X 射线晶体学光线跟踪分析吸收校正

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Applied Crystallography 化学-晶体学

CiteScore

10.00

自引率

3.30%

发文量

178

审稿时长

4.7 months

期刊介绍： Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.