A Novel Distributed Process Monitoring Framework of VAE-Enhanced with Deep Neural Network

IF 2.6 4区 计算机科学 Q3 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE
Ming Yin, Jiayi Tian, Yibo Wang, Jijiao Jiang
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Abstract

Intelligent manufacturing process needs to adopt distributed monitoring scenario due to its massive, high-dimensional and complex data. Distributed process monitoring has been introduced into global monitoring and local monitoring to analyze the characteristic relationship between process data. However, the existing framework methods ignore or suppress the fault information and thus cannot effectively identify the local faults and the time sequence characteristics between units in the batch production system. This paper proposes a novel distributed process monitoring framework based on Girvan-Newman algorithm modular subunit partitioning and probabilistic learning model with deep neural networks. First, Girvan-Newman algorithm is used to divide the complex manufacturing system modularized to reduce the latitude of data processing. Second, variational autoencoder (VAE) is adopted to ensure the stability of local analysis, and long short-term memory is adopted to improve the VAE model to detect global multi-time scale anomalies. Finally, distributed process fault detection is carried out for each subunit in a separate and integrated manner, and the performance of the framework in distributed process monitoring is analyzed through two fault detection indicators T2 and SPE statistics. A case study of the Tennessee Eastman Process is used to demonstrate the performance and applicability of the proposed framework. Results show that the proposed VAE enhancement framework based on the DNN could accurately identify faults in distributed process monitoring and locate the specific sub-units where the fault occurs. Compared with VAE-DNN method and traditional process monitoring methods, the framework proposed in this paper has higher fault detection rate and lower false alarm rate, and the detection rate of some faults can reach 100%.

Abstract Image

利用深度神经网络增强 VAE 的新型分布式过程监控框架
由于海量、高维和复杂的数据,智能制造过程需要采用分布式监控方案。分布式过程监控被引入到全局监控和局部监控中,以分析过程数据之间的特征关系。然而,现有的框架方法忽略或压制了故障信息,因此无法有效识别批量生产系统中的局部故障和单元间的时序特征。本文提出了一种基于 Girvan-Newman 算法模块化子单元划分和深度神经网络概率学习模型的新型分布式过程监控框架。首先,利用 Girvan-Newman 算法对复杂的制造系统进行模块化划分,以降低数据处理的难度。其次,采用变异自动编码器(VAE)确保局部分析的稳定性,并采用长短期记忆改进 VAE 模型,以检测全局多时间尺度的异常。最后,以独立和集成的方式对每个子单元进行分布式流程故障检测,并通过 T2 和 SPE 统计这两个故障检测指标分析该框架在分布式流程监控中的性能。以田纳西州伊士曼工艺为例,展示了所提框架的性能和适用性。结果表明,基于 DNN 的 VAE 增强框架可以准确识别分布式过程监控中的故障,并定位故障发生的特定子单元。与 VAE-DNN 方法和传统过程监控方法相比,本文提出的框架具有更高的故障检测率和更低的误报率,某些故障的检测率可达 100%。
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来源期刊
Neural Processing Letters
Neural Processing Letters 工程技术-计算机:人工智能
CiteScore
4.90
自引率
12.90%
发文量
392
审稿时长
2.8 months
期刊介绍: Neural Processing Letters is an international journal publishing research results and innovative ideas on all aspects of artificial neural networks. Coverage includes theoretical developments, biological models, new formal modes, learning, applications, software and hardware developments, and prospective researches. The journal promotes fast exchange of information in the community of neural network researchers and users. The resurgence of interest in the field of artificial neural networks since the beginning of the 1980s is coupled to tremendous research activity in specialized or multidisciplinary groups. Research, however, is not possible without good communication between people and the exchange of information, especially in a field covering such different areas; fast communication is also a key aspect, and this is the reason for Neural Processing Letters
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