High-resolution correlative imaging in ultrafast electron microscopy

IF 7.7 2区物理与天体物理 Q1 PHYSICS, MULTIDISCIPLINARY

Advances in Physics: X Pub Date : 2024-02-18 DOI:10.1080/23746149.2024.2316710

Ye-Jin Kim, Won-Woo Park, Hak-Won Nho, Oh-Hoon Kwon

引用次数: 0

Abstract

Ultrafast electron microscopy (UEM) has a broad scope of application across material systems and scientific disciplines. In UEM, we investigate multiscale dynamics in the spatial domain ranging fro...

查看原文本刊更多论文

超快电子显微镜的高分辨率关联成像

超快电子显微镜（UEM）在材料系统和科学学科中有着广泛的应用。在超快电子显微镜中，我们研究空间领域的多尺度动态，包括...

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Advances in Physics: X Physics and Astronomy-General Physics and Astronomy

CiteScore

13.60

自引率

0.00%

发文量

审稿时长

13 weeks

期刊介绍： Advances in Physics: X is a fully open-access journal that promotes the centrality of physics and physical measurement to modern science and technology. Advances in Physics: X aims to demonstrate the interconnectivity of physics, meaning the intellectual relationships that exist between one branch of physics and another, as well as the influence of physics across (hence the “X”) traditional boundaries into other disciplines including: Chemistry Materials Science Engineering Biology Medicine