Evolutionary Algorithm-Inspired Binary Sequence-Based Hybrid Fault Detection Method for Nonuniformly Excited Linear Antenna Array

IF 0.9 4区工程技术 Q4 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS

International Journal of RF and Microwave Computer-Aided Engineering Pub Date : 2024-01-05 DOI:10.1155/2024/9976061

Sandipan Mitra, Soumyo Chatterjee, Sayan Chatterjee, Bhaskar Gupta

引用次数: 0

Abstract

In this article, a novel method of fault detection in nonuniformly excited linear antenna array has been reported. This method uses an evolutionary algorithm-based technique to generate approximate radiation pattern in tune with reference faulty pattern for a nonuniformly excited linear antenna array. Based on the approximation, a binary sequence-based method of exact fault detection has been developed. In order to illustrate the effectiveness of the method, 12- and 20-element Dolph Tschebyscheff linear antenna array with amplitude fault has been considered. Superiority of the proposed method has been demonstrated through comparative study.

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进化算法启发的基于二进制序列的非均匀激励线性天线阵列混合故障检测方法

本文报告了一种新型的非均匀激励线性天线阵故障检测方法。该方法采用基于进化算法的技术，为非均匀激励线性天线阵列生成与参考故障模式一致的近似辐射模式。在近似的基础上，开发了一种基于二进制序列的精确故障检测方法。为了说明该方法的有效性，考虑了具有振幅故障的 12 元和 20 元 Dolph Tschebyscheff 线性天线阵列。通过对比研究，证明了所提方法的优越性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

International Journal of RF and Microwave Computer-Aided Engineering 工程技术-工程：电子与电气

CiteScore

4.00

自引率

23.50%

发文量

489

审稿时长

3 months

期刊介绍： International Journal of RF and Microwave Computer-Aided Engineering provides a common forum for the dissemination of research and development results in the areas of computer-aided design and engineering of RF, microwave, and millimeter-wave components, circuits, subsystems, and antennas. The journal is intended to be a single source of valuable information for all engineers and technicians, RF/microwave/mm-wave CAD tool vendors, researchers in industry, government and academia, professors and students, and systems engineers involved in RF/microwave/mm-wave technology. Multidisciplinary in scope, the journal publishes peer-reviewed articles and short papers on topics that include, but are not limited to. . . -Computer-Aided Modeling -Computer-Aided Analysis -Computer-Aided Optimization -Software and Manufacturing Techniques -Computer-Aided Measurements -Measurements Interfaced with CAD Systems In addition, the scope of the journal includes features such as software reviews, RF/microwave/mm-wave CAD related news, including brief reviews of CAD papers published elsewhere and a "Letters to the Editor" section.