The mechanism of moire artifacts in single-grating imaging systems and image quality optimization.

IF 1.7 3区 医学 Q3 INSTRUMENTS & INSTRUMENTATION
Fangke Zong, Jun Yang, Jun Jiang, JinChuan Guo
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引用次数: 0

Abstract

In the X-ray single-grating imaging system, the acquisition of frequency information is the key step of phase-contrast and scattering information recovery. In the process of information extraction, it is easy to lead to the degradation of imaging quality due to the Moire Artifact, thus limiting the development and application of X-ray single-grating imaging system. In order to address the above problems, in this article, based on the theoretical analysis of the generation principle of Moire Artifact in imaging system, the advantages and disadvantages of grating rotation method are analyzed, and a method of suppressing Moire artifacts by adjusting grating projection frequency is proposed. The experimental results show that the method proposed here can suppress the Moire noise in the background noise, resulting in a reduction of more than 50% in the standard deviation of the background noise. High quality phase-contrast and scattering images are obtained experimentally, which is of great value to the development of X-ray single-grating imaging technology.

单光栅成像系统的摩尔伪影机理及图像质量优化。
在 X 射线单光栅成像系统中,频率信息的获取是相位对比和散射信息复原的关键步骤。在信息提取过程中,容易因摩尔伪影导致成像质量下降,从而限制了 X 射线单光栅成像系统的发展和应用。针对上述问题,本文在理论分析成像系统中摩尔伪影产生原理的基础上,分析了光栅旋转方法的优缺点,提出了一种通过调整光栅投影频率来抑制摩尔伪影的方法。实验结果表明,本文提出的方法可以抑制背景噪声中的摩尔纹噪声,使背景噪声的标准偏差降低 50%以上。实验获得了高质量的相位对比和散射图像,对 X 射线单光栅成像技术的发展具有重要价值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
4.90
自引率
23.30%
发文量
150
审稿时长
3 months
期刊介绍: Research areas within the scope of the journal include: Interaction of x-rays with matter: x-ray phenomena, biological effects of radiation, radiation safety and optical constants X-ray sources: x-rays from synchrotrons, x-ray lasers, plasmas, and other sources, conventional or unconventional Optical elements: grazing incidence optics, multilayer mirrors, zone plates, gratings, other diffraction optics Optical instruments: interferometers, spectrometers, microscopes, telescopes, microprobes
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