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I/O-signature-based feature analysis and classification of high-performance computing applications

IF 4.3 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
ACS Applied Electronic Materials Pub Date : 2023-09-24 DOI:10.1007/s10586-023-04139-y
Ju-Won Park, Xin Huang, Jae-Kook Lee, Taeyoung Hong
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基于I/ o特征的高性能计算应用特征分析与分类
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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来源期刊
ACS Applied Electronic Materials
ACS Applied Electronic Materials Multiple-
CiteScore
7.20
自引率
4.30%
发文量
567
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