Interface properties and failures of REBCO coated conductor tapes: Research progress and challenges

IF 5.6 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Peifeng Gao , Yameng Zhang , Xingzhe Wang , Youhe Zhou
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引用次数: 0

Abstract

RE-Ba-Cu-O (REBCO, where RE = Y, Gd, Sm, and other rare earth elements) coated conductor (CC) tapes are promising for applications in high-energy physics and high-field science owing to their significant advantages such as high critical magnetic field, high current density, and the ability to achieve superconductivity at liquid nitrogen temperatures. Nevertheless, the mechanical and superconducting performances of these CC tapes are significantly affected by interface failures, such as interfacial delamination and coating fractures, which arise from the complex interplay of mechanical stress induced by magnet processing, thermal mismatch stress during cooling, electromagnetic stress under high magnetic fields, and thermal stress during quenching. This study comprehensively reviews the interface properties and failure behavior of REBCO CC tapes. First, the research progress in characterizing the intricate interface properties of REBCO CC is systematically reviewed. Furthermore, the interface failure behavior in extreme multifield environments was analyzed and summarized. Subsequently, this study outlines optimization strategies to mitigate interface failure risks in REBCO superconducting magnet structures. Finally, we address the current challenges and future perspectives on interface issues in REBCO CC tapes. By addressing these challenges, this study offers valuable insights for advancing the development and practical implementation of superconducting technologies in diverse applications.

REBCO涂层导体带的界面特性与失效:研究进展与挑战
RE- ba - cu - o (REBCO,其中RE = Y, Gd, Sm和其他稀土元素)涂层导体(CC)带由于具有高临界磁场,高电流密度和在液氮温度下实现超导性等显著优点,在高能物理和高场科学中应用前景广阔。然而,由于磁体加工引起的机械应力、冷却过程中的热失配应力、强磁场下的电磁应力和淬火过程中的热应力的复杂相互作用,导致了界面分层和涂层断裂等界面失效,从而显著影响了CC带的机械性能和超导性能。本文对REBCO CC带的界面特性和失效行为进行了全面的综述。首先,系统综述了REBCO CC复杂界面性质表征的研究进展。此外,对极端多场环境下的界面失效行为进行了分析和总结。随后,本研究概述了降低REBCO超导磁体结构界面失效风险的优化策略。最后,我们讨论了REBCO CC磁带中接口问题的当前挑战和未来前景。通过解决这些挑战,本研究为推进超导技术在各种应用中的发展和实际实施提供了有价值的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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CiteScore
3.90
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