Development of an X-Ray Technique for Measuring Grain Size as aFunction of Orientation in Polycrystalline Materials

Abstract

A new application of the X-ray technique developed by B.E. Warren [1], is presented here. The method, based on statistical fluctuation of counts recorded by a properly modified X-ray diffractometer, has been used to estimate the average grain diameter of different textural classes in metallic polycrystalline materials; it has been tested to evaluate its reproducibility and precision limits. The method appears to be promising for current applications in industrial research laboratories and for quality control routines since specimen preparation is easy and measurement is automated.