{"title":"IC Design & Test","authors":"","doi":"10.1109/isqed48828.2020.9137049","DOIUrl":null,"url":null,"abstract":"IC Design & Test","PeriodicalId":225828,"journal":{"name":"2020 21st International Symposium on Quality Electronic Design (ISQED)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 21st International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/isqed48828.2020.9137049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0