1-V fast I/sub DDQ/ current sensor for on-line mixed-signal/analog test

Abstract

This paper proposes a novel, ultra low-voltage design of a built-in current sensor for testing mixed-signal circuits. Designed in 0.18 /spl mu/ CMOS technology, the monitor is based on the principle of a current mirror that is supported by the converting and output stages. The design is easily applicable in testing mixed-signal circuits. The sensor is designed for the power supply of 1.0 V that offers acceptance in low-voltage test applications. Presented results demonstrate excellent performances of the on-chip monitor.