All-dielectric metasurfaces for measuring multi-photon quantum-polarization states (Conference Presentation)

Kai Wang, James G. Titchener, S. Kruk, Lei Xu, Hung-Pin Chung, M. Parry, I. Kravchenko, Yen-Hung Chen, A. Solntsev, Y. Kivshar, D. Neshev, A. Sukhorukov
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Abstract

With recent advances in nanophotonics, metasurfaces based on nano-resonators have facilitated novel types of optical devices. In particular, the interplay between different degrees of freedom, involving polarization and spatial modes, boosted classical polarization measurements and imaging applications. However, the use of metasurfaces for measuring the quantum states of light remains largely unexplored. Conventionally, the task of quantum state tomography is realized with several bulk optical elements, which need to be reconfigured multiple times. Such setups can suffer from decoherence, and there is a fundamental and practical interest in developing integrated solutions for measurement of multi-photon quantum states. We present a new concept and the first experimental realization of all-dielectric metasurfaces with no tuneable elements for imaging-based reconstruction of the full quantum state of entangled photons. Most prominently, we implement multi-photon interferometric measurements on a sub-wavelength thin optical element, which delivers ultimate miniaturization and extremely high robustness. Specifically, we realize a highly transparent all-dielectric metasurface, which spatially splits different components of quantum-polarization states. Then, a simple one-shot measurement of correlations with polarization-insensitive on-off click detectors enables complete reconstruction of multi-photon density matrices with high precision. In our experiment, we prepare sets of polarization states and reconstruct their density matrices with a high fidelity of over 99% for single photon states and above 95% for two-photon states. Our work provides a fundamental advance in the imaging of quantum states, where multi-photon quantum interference takes place at sub-wavelength scale.
用于测量多光子量子偏振态的全介电超表面(会议报告)
随着纳米光子学的最新进展,基于纳米谐振器的超表面促进了新型光学器件的发展。特别是,涉及偏振和空间模式的不同自由度之间的相互作用,促进了经典偏振测量和成像应用。然而,利用超表面来测量光的量子态在很大程度上仍未被探索。传统上,量子态层析成像的任务是由几个大块光学元件实现的,这些光学元件需要多次重新配置。这样的设置可能会受到退相干的影响,因此开发多光子量子态测量的集成解决方案是一个基本的和实际的兴趣。我们提出了一个新的概念,并首次实验实现了无可调谐元件的全介电超表面,用于基于成像重建纠缠光子的全量子态。最突出的是,我们在亚波长薄光学元件上实现了多光子干涉测量,从而实现了最终的小型化和极高的鲁棒性。具体来说,我们实现了一个高度透明的全介电超表面,它在空间上分裂了量子偏振态的不同组分。然后,使用偏振不敏感的开关点击探测器对相关性进行简单的一次测量,可以高精度地完全重建多光子密度矩阵。在我们的实验中,我们制备了一组偏振态并重建了它们的密度矩阵,单光子态的保真度超过99%,双光子态的保真度超过95%。我们的工作为量子态成像提供了一个根本性的进步,其中多光子量子干涉发生在亚波长尺度上。
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