Yield-award placement optimization for Switched-Capacitor analog integrated circuits

Chien-Chih Huang, Jwu-E Chen, Pei-Wen Luo, C. Wey
{"title":"Yield-award placement optimization for Switched-Capacitor analog integrated circuits","authors":"Chien-Chih Huang, Jwu-E Chen, Pei-Wen Luo, C. Wey","doi":"10.1109/SOCC.2011.6085127","DOIUrl":null,"url":null,"abstract":"Paralleling square unit capacitors have been commonly used for Switched-Capacitor circuits to achieve higher accurate capacitor ratio. However, the capacitor ratio may be shifted due to the wire interconnection of these unit capacitors. The small capacitor ratio shift may cause a significant yield drop. The ratio shift can be reduced by using extra circuitry to achieve parasitic insensitive design. This study presents a simple a layout modification to alleviate the ratio shift, thus enhancing yield, without requiring extra circuitry.","PeriodicalId":365422,"journal":{"name":"2011 IEEE International SOC Conference","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International SOC Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOCC.2011.6085127","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Paralleling square unit capacitors have been commonly used for Switched-Capacitor circuits to achieve higher accurate capacitor ratio. However, the capacitor ratio may be shifted due to the wire interconnection of these unit capacitors. The small capacitor ratio shift may cause a significant yield drop. The ratio shift can be reduced by using extra circuitry to achieve parasitic insensitive design. This study presents a simple a layout modification to alleviate the ratio shift, thus enhancing yield, without requiring extra circuitry.
开关电容模拟集成电路的产量奖励放置优化
并联方形单元电容器常用于开关电容电路,以获得更高的精确电容比。然而,由于这些单位电容器的电线互连,电容器比率可能会发生变化。小的电容比变化可能会导致显著的良率下降。利用额外的电路实现寄生不敏感设计,可以减小比移。本研究提出了一个简单的布局修改,以减轻比率移位,从而提高良率,而不需要额外的电路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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