Distributed-Memory Based FPGA Debug: Design Timing Impact

R. Hale, B. Hutchings
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引用次数: 1

Abstract

In FPGAs, debug observability is often achievedby attaching memory-based recording circuitry to user signals. Block-RAM (BRAM)-based embedded logic analyzers are ofteninserted into user circuits to observe circuit behavior. Incontrast with BRAM-based approaches, distributed memory:1) is almost always available (user circuits may consume allBRAMs but even highly utilized circuits contain unused LUTs), and 2) can usually be physically located very near to user signals(LUTs are spread across the entire device while BRAMs arelocated only in specific columns). Previous work has shownbasic feasibility and demonstrated that distributed memoriescan provide debug observability for highly utilized circuits. Thispaper focuses on timing impacts and describes the quantitativetradeoff between FPGA device utilization, debug probe count, and clock frequency. For example, a design with 70% of LUTsutilized, with no debug logic, can operate at a minimum clockperiod of 5ns. Instrumenting 300 debug probes increases thisperiod to 7ns, and 1500 probes to 8ns. Placing trace bufferswith a simulated annealing algorithm improved success ratesfrom 20% to 50% depending on the design and probe count.
基于分布式内存的FPGA调试:设计时序影响
在fpga中,调试可观察性通常是通过将基于存储器的记录电路附加到用户信号中来实现的。基于块ram (BRAM)的嵌入式逻辑分析仪经常被插入到用户电路中以观察电路的行为。与基于bram的方法相比,分布式内存:1)几乎总是可用的(用户电路可能消耗所有bram,但即使是高度利用的电路也包含未使用的lut), 2)通常可以在物理上非常靠近用户信号(lut分布在整个设备中,而bram仅位于特定列中)。以前的工作已经证明了基本的可行性,并证明分布式存储器可以为高利用率的电路提供调试可观察性。本文着重于时序影响,并描述了FPGA器件利用率、调试探头计数和时钟频率之间的定量权衡。例如,一个利用率为70%的设计,在没有调试逻辑的情况下,可以在最小5ns的时钟周期内工作。测试300个调试探针将这个周期增加到7ns, 1500个探针将这个周期增加到8ns。使用模拟退火算法放置跟踪缓冲可以将成功率从20%提高到50%,具体取决于设计和探针计数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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