A. Herkersdorf, M. Engel, M. Glaß, J. Henkel, V. Kleeberger, Johannes Maximilian Kühn, P. Marwedel, Daniel Mueller-Gritschneder, S. Nassif, Semeen Rehman, W. Rosenstiel, Ulf Schlichtmann, M. Shafique, J. Teich, N. Wehn, C. Weis
{"title":"RAP Model—Enabling Cross-Layer Analysis and Optimization for System-on-Chip Resilience","authors":"A. Herkersdorf, M. Engel, M. Glaß, J. Henkel, V. Kleeberger, Johannes Maximilian Kühn, P. Marwedel, Daniel Mueller-Gritschneder, S. Nassif, Semeen Rehman, W. Rosenstiel, Ulf Schlichtmann, M. Shafique, J. Teich, N. Wehn, C. Weis","doi":"10.1007/978-3-030-52017-5_1","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"233 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Dependable Embedded Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-52017-5_1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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