A machine vision system with an irregular imaging function

Abstract

Traditional machine vision systems sample images at a fixed resolution and a presetting speed in one inspection. When detecting small defects in a large background, there is usually a large amount of redundancy in the image data. To solve this problem, a machine vision system with an irregular imaging function is presented in the paper. The system can irregularly sample images with a high resolution in the defect area and a low resolution in the background area, which reduces the total data in image processing and increases the speed and accuracy of real-time inspection significantly.