Oharacteristics of FIN Lines with Arbitrary Dimensions Calculated from Data for Lines in Standard Enclosures

Abstract

The dispersion characteristics of fin lines with arbitrary dimensions can be obtained from data published for fin lines centered in standard waveguide enclosures. The procedure is based on the transverse resonance method which has been widely used in the past to evaluate the properties of slab-loaded waveguides, ridged waveguides and similar structures.