{"title":"On-line testing of switched-capacitor filters","authors":"J. Huertas, D. Vázquez, A. Rueda","doi":"10.1109/VTEST.1992.232732","DOIUrl":null,"url":null,"abstract":"Proposes a new solution to alleviate the area overhead when replication is used in switched-capacitor filters. This new approach, although based on the voter mechanism, only requires a programmable biquad and some control logic as extra components (instead of the full duplication of the system). To some extent, it can be considered a first intent to apply information redundancy for the concurrent test of analog circuits.<<ETX>>","PeriodicalId":434977,"journal":{"name":"Digest of Papers. 1992 IEEE VLSI Test Symposium","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 1992 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1992.232732","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25
Abstract
Proposes a new solution to alleviate the area overhead when replication is used in switched-capacitor filters. This new approach, although based on the voter mechanism, only requires a programmable biquad and some control logic as extra components (instead of the full duplication of the system). To some extent, it can be considered a first intent to apply information redundancy for the concurrent test of analog circuits.<>