Influence of short voltage pulses on thick-film resistors at elevated temperature

Damian Nowak, Konrad Idziorek
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Abstract

This paper presents systematic studies of geometrical and electrical properties of thick-film resistors with dimensions from 0.3×0.3 mm2 to 0.6×1.5 mm2. Test structures were prepared basing on commercially available resistive pastes (DuPont 2000 series) with different sheet resistance. Structures were manufactured on standard alumina substrates. Additionally, part of structures were covered with protective overglaze layer. The geometrical parameters and electrical properties are correlated with durability of resistors to short electrical pulses applied to the structures at room as well as elevated temperature up to 300 °C. There were analyzed allowable electric field and surface power density for resistors in dependence of resistor dimensions and temperature (the criterion of relative resistance changes smaller than ±10% was assumed).
高温下短电压脉冲对厚膜电阻的影响
本文系统地研究了尺寸从0.3×0.3 mm2到0.6×1.5 mm2的厚膜电阻器的几何和电性能。测试结构是基于市售的具有不同片材电阻的电阻膏(杜邦2000系列)制备的。结构是在标准氧化铝衬底上制造的。此外,部分结构还覆盖了保护性的上釉层。几何参数和电性能与电阻在室内和高达300°C的高温下对结构施加的短电脉冲的耐久性相关。分析了电阻器的允许电场和表面功率密度与电阻器尺寸和温度的关系(假设相对电阻变化小于±10%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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